Welcome to the AMCORe XRD Facility (AXF)

An X-Ray Facility within the Advanced Materials Centre of Research at the University of Windsor

We provide fast and high-quality laboratory services for characterization of a wide range of crystalline materials including metals (alloys), minerals, specialty chemicals and pharmaceuticals. 

Why us?

  • We have the capabilites for rapid XRD screening and can provide fast turn around time. 
  • Whether you have one sample, or hundreds we can handle them in just a few days!
  • Minimal amount of sample is also required (just a few milligrams of powder is more than enough)
  • We are able to perform SC-XRD and PXRD analyses on air/light sensitive materials
  • Our facility provides not only variable temperature (VT) but also variable pressure (VP) PXRD services 
  • We use only state-of-the-art crystallography software to ensure high quality data analysis
  • Our collaboration with PROTO Mfg. allows us to offer customized solutions to support your most challenging samples and ambitious experiments 

Powder X-ray diffraction

PROTO LPD-HT (High Throughput Screening)
  • Designed for high-throughput screening and in-situ analysis
  • High flux microfocus Cu X-ray source
  • Large soid-state area detector (Dectris Eiger 2 1R)
  • Direct photon counting (high sensitivity / no noise)
  • Sample loading - as little as 3 mg required for typical phase identification
  • Compatible with standar 96 well-plates that are used by pharmaceutical companies worldwide
  • Collection of 96 samples from 0 to 55° (2θ) in 2-3 hours
  • High angular range 0-150° (2θ)
  • High angular resolution (FWHM as low as 0.065°)
  • Flexible geometry: transmission and reflection
  • Ideal geometry to minimize preferred orientation in samples
  • Equipped with a capillary stage for non-ambient studies
  • Variable temperature and pressure phase analysis
Powder X-ray diffraction is a powerful technique used for identification and characterization of solid-state materials consisting of single or multiple phases. PXRD is widely employed for material identification, quantification, crystalite size determination, and the characterization of materials under non-ambient conditions (e.g. temperature, pressure, humidity etc.) PXRD analysis can also be particulary helpful for monitoring solid-state reactions and transformations, such as materials obtained via mechanochemical methods. 

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We provide the following PXRD services:
  • Phase analysis (qualitative & quantitative)
  • Unit-cell determination
  • VT/VP-studies (phase transitions, polymorphism, thermal expansion)
  • Structure determination (solution with real-space methods and Rietveld refinement)
  • CIF compilation and structure illustration
 PROTO AXRD Benchtop
  • Bragg Brentano Geometry (θ/2θ) 
  • ​Sealed tube Cu X-ray source
  • Dectris Mythen 1K Hybrid Pixel Solid-state Si Strip Detector
  • Wide angular coverage 1-150° (2θ)
  • High angular resolution (FWHM = 0.035°)
  • Excellent accuracy: Δ2θ < ±0.02°
  • Equipped with Anton Paar BTS VT-Stage (up to 500 C)
  • Sealed sample holders for air/moisture sensitive materials

Single-Crystal X-ray diffraction

X-ray diffraction analysis of a single crystal is the gold standard for molecular structure determination of a solid-state material. This type of analysis allows for the determination of absolute configuration, bond distances and angles, distribution of electron density, and disorder.
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We provide the following SC-XRD services:
  • Crystal screening
  • Unit-cell determination (indexing including crystal faces)
  • Cambridge Structural Database Search
  • Data acquisition (from 80 to 400 K)
  • Complete structure determination (including indexing, data acquisition, structure solution, refinement, and CIF report)

Bruker D8 Venture
  • Dual X-ray source: IμS 3.0 Cu, and sealed tube Mo
  • PHOTON II counting detector (large angular range)
  • Oxford Cryostream 800 (80-400 K, stability in excess if 0.1 K)

Primary Facility Contact

Dr. Anton Dmitrienko
X-ray Crystallographer
AMCOReXRD@uwindsor.ca

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